device characteristic

英 [dɪˈvaɪs ˌkærəktəˈrɪstɪk]

美 [dɪˈvaɪs ˌkærəktəˈrɪstɪk]

网络  设备特性

网络

英英释义

noun

• any measurable property of a device measured under closely specified conditions
  Synonym:characteristic

双语例句

• Structure and Device Characteristic of Al_xGa_ ( 1-x) As/ GaAs Solar Cells
  A1xGa（1－x）As／GaAs太阳电池的结构观察和器件性能
• If you need to be made device characteristic curves.
  如果需要的话还应作出装置特性曲线。
• Based on the systematic and detailed analysis on the correlation between material structure parameters and device characteristic parameters, the design principle and design method on RTD material structure were established. And the MBE material structure on RTD for SI-GaAs substrate was designed by this design method.
  在系统细致分析RTD材料结构参数与器件特性参数关系的基础上，确立了RTD材料结构的设计原则和设计方法，并对以SI-GaAs为衬底的RTD分子束外延（MBE）材料生长结构进行了设计。
• This paper studies the effect of a device's techniques characteristic on desulfurization efficiency through the establishment of a hydration activation desulfurization device.
  通过建立水合活化固硫试验装置，研究装置的工艺特性对装置脱硫率的影响规律。
• Gives a method to reconstruct the present experimental device of measuring mechanical parts 'shape and position errors applying errors separating technology, Which will make the present device has the characteristic of advanced measuring technology, more measuring items and high automatic level
  提出应用误差分离技术对现有机械零件形位误差实验设备进行改造的方法，使现有设备的测量技术先进、测量误差项目多、自动化水平高
• The experimental research of low-lift axial flow pump model device is introduced simply. According to experimental results. we conduct similarity conversion on true pumps device characteristic at different impeller diameter.
  简要介绍了低扬程轴流泵模型装置的试验研究，根据试验结果进行了不同转轮直径下实型泵装置特性的相似换算，该成果可以作为低扬程轴流泵站设计的参考。
• The IC processing and device characteristic CAD system are very important parts in the microelectronic CAD system.
  集成电路工艺及器件特性计算机辅助设计系统是微电子CAD系统的重要组成部分。
• Design of cooling tower monitoring device based on characteristic model
  基于特征模型的冷却塔监控装置设计
• On the foundation of the existing test equipment, we have researched and developed the test system that can measure liquid crystal material structure parameter and liquid crystal device characteristic.
  在现有液晶测试设备基础上，研发了针对液晶材料结构参数和液晶器件显示特性进行测量的测试系统。
• Based on study, measurement and analysis of device noise power-spectrum, a fault-location approach that took advantage of device noise-characteristic and combined it with circuit theory was first proposed.
  在研究、测试、分析器件噪声功率谱的基础上，利用器件噪声的特性，结合电路理论，首次提出对故障组件内的故障元件进行测试定位和比较放大器输入端电阻阻值大小的研究方法。